/PRNewswire-PRWeb/ -- For decades, the semiconductor industry has faced two critical challenges: the hidden limitations of dark silicon and the bottlenecks of...
"At the heart of semiconductor innovation lies the ability to measure and optimize materials at the nanoscale," said Edu Sciammarella, CEO of NanoFraction. "Our technology bridges the gap between the limitations of current tools and the evolving demands of advanced packaging designs." Post this Dark silicon—where portions of chips remain unpowered due to power and thermal constraints—has long hindered the industry's ability to optimize chip architectures. Compounding this issue, traditional SEM, while invaluable for material characterization, often struggles to meet the speed and scalability demands of modern semiconductor production. Together, these barriers slow progress and keep semiconductor innovation in the shadows. NanoFraction's PHASE (Physics-based Holography and AI Super-resolution Engine) platform redefines the possibilities of nanoscale discovery and defect detection, offering faster, more scalable solutions for today's challenges. Introducing DHOM: The Core of the PHASE Platform At the heart of PHASE lies Digital Holographic Optical Moiré (DHOM), an advanced technology that combines an ensemble of robotic nanoscopes and a neural compute grid to deliver multi-scale digital twins of materials like diamond and silicon carbide. By scanning at millimeter, micron, and nanometer levels, DHOM achieves a world-first resolution of 1 nanometer. Building on this robust foundation, PHASE integrates: AI Super-Resolution Stack: Combines physics-based optical super-resolution with AI-driven…